Enhanced light element imaging in atomic resolution scanning transmission electron microscopy
نویسندگان
چکیده
منابع مشابه
Atomic-Resolution Imaging and Analysis with Cs-Corrected Scanning Transmission Electron Microscopy
Advances in nanotechnology and electronic device miniaturization are making atomic-level control of structure and composition increasingly important. To promote research and development in this field, it is essential to develop technology for measuring the structures, compositions, and properties of materials and devices with atomic resolution. Scanning transmission electron microscopy (STEM), ...
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ژورنال
عنوان ژورنال: Ultramicroscopy
سال: 2014
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2013.07.019